Facilities
Electron Microscopes
Transmission Electron Microscope (JEM-2100F) @CCRF
JEM-ARM200F / Jeol
aberration corrected (S)TEM
(will be available at 2024) @CCRF
Fusion Select / Protochips : In-situ electrothermal TEM holder
(Heating + Biasing) with AXON Synchronicity module
JEM-2010 / Jeol : TEM @ECEP
Focused Ion Beam / FEI, Helios G3 CX @ CCRF
FE-EPMA / Jeol JXA-8530F Plus @ CCRF
JSM-5610 / Jeol : Normal SEM with EDS
SU5000 / Hitach : FE-SEM with EDS/EBSD @Core center
JSM-7900F / Jeol : FE-SEM with EDS
@ECEP
Sample preparation facilities
MultiPrep system
Gatan PIPS II
(Ion polishing)
@CCRF
Metprep 1X precision grinder/polisher
Techcut
Low speed saw
Gatan Dimpler
@CCRF
Materials Process
Furnace with Turbo pump, H2, N2 gas available
Plenatary Baill Mill, PM 100