Facilities

Electron Microscopes

Transmission Electron Microscope (JEM-2100F) @CCRF

 

JEM-ARM200F / Jeol

aberration corrected (S)TEM

(will be available at 2024) @CCRF

  

Fusion Select / Protochips : In-situ electrothermal TEM holder
(Heating + Biasing) with AXON Synchronicity module

JEM-2010 / Jeol : TEM @ECEP

Focused Ion Beam / FEI, Helios G3 CX @ CCRF

FE-EPMA / Jeol JXA-8530F Plus @ CCRF

JSM-5610 / Jeol : Normal SEM with EDS

SU5000 / Hitach : FE-SEM with EDS/EBSD @Core center

JSM-7900F / Jeol : FE-SEM with EDS
@ECEP

Sample preparation facilities

MultiPrep system

Gatan PIPS II
(Ion polishing)
@CCRF

Metprep 1X precision grinder/polisher

Techcut
Low speed saw

Gatan Dimpler
@CCRF

Materials Process

Furnace with Turbo pump, H2, N2 gas available

Planetary Ball Mill, PM 100