Facilities

Electron Microscopes

Transmission Electron Microscope (JEM-2100F) @CCRF

 

JEM-ARM200F / Jeol

aberration corrected (S)TEM

(will be available at 2024) @CCRF

  

Fusion Select / Protochips : In-situ electrothermal TEM holder
(Heating + Biasing) with AXON Synchronicity module

JEM-2010 / Jeol : TEM @ECEP

JSM-5610 / Jeol : Normal SEM with EDS

SU5000 / Hitach : FE-SEM with EDS/EBSD @Core center

JSM-7900F / Jeol : FE-SEM with EDS
@ECEP

Sample preparation facilities

MultiPrep system
(will be available
by May 2023)

Gatan PIPS II
(Ion polishing)
@CCRF

Metprep 1X precision grinder/polisher

Techcut
Low speed saw

Gatan Dimpler
@CCRF

Materials Process

Furnace with Turbo pump, H2, N2 gas available

Plenatary Baill Mill, PM 100